Popkov K. A. «A method for constructing logic networks allowing short single diagnostic tests» // Applied Discrete Mathematics 2019. №46 C.38-57
Popkov K. A. «Short single fault detection tests for logic networks under arbitrary faults of gates» // Applied Discrete Mathematics 2022. №55 C.59-76
Barsukova O. Yu., Alekhina M. A. «Estimations of unreliability of circuits in Rosser - Turkett basis (in P3) with faults of type 0 at the outputs of gates» // Applied Discrete Mathematics 2017. №37 C.62-75
Popkov K. A. «Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits» // Applied Discrete Mathematics 2016. №4(34) C.65-73
Popkov K. A. «Single fault detection tests for logic networks of AND, NOT gates» // Applied Discrete Mathematics 2017. №38 C.66-88
Popkov K. A. «Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates» // Applied Discrete Mathematics 2019. №43 C.78-100
Popkov K. A. «On logic networks allowing short single fault detection tests under arbitrary faults of gates» // Applied Discrete Mathematics 2021. №51 C.85-100
Popkov K. A. «Short complete diagnostic tests for circuits with one additional input in the standard basis» // Applied Discrete Mathematics 2022. №56 C.104-112
Alekhina M. A., Barsukova O. Yu. «The reliability of circuits in Rosser - Turkett basis (in P3) with faults of type 0 at the outputs of gates» // Applied Discrete Mathematics. Supplement 2017. №10 C.124-126
