Analysis and processing of AFM images of anodic aluminum oxide

Atomic force microscopy is a unique method that allows to see and measure the surface structure of a sample quickly, with high resolution and accuracy. Atomic force microscopy greatly simplifies the study of the surface of anodic aluminum oxide. Over the past 20 years of its existence the AFM method has opened wide opportunities for comprehensive study of morphology and different local properties of the surface. In this aspect, its undoubted advantages include: 1) the ability to conduct studies in a wide temperature range in air, in vacuum, in liquid and gaseous media; 2) the absence of limitations related to the conductivity of the sample; 3) the possibility of conducting precision measurements of surface topography, overlapping several orders of magnitude in length; 4) the potential of the microscope as a tool for local surface modification. When developing new AFM techniques, we often have to face a number of problems: 1) the problem of influence on measurement results of factors of very different origin (hardware or methodological); 2) the problem of interpretation of AFM images obtained in different modes and different conditions; 3) the problem of metrological support of AFM measurements, related to obtaining reliable quantitative characteristics, allowing the most complete and adequate description of surface microreliefproperties. Processing and analysis of obtained AFM images remains an important task, often it is not possible to make a good image, since there are many factors that reduce the quality. Such factors include: state of the microscope probe, scanning time, scanning conditions, various kinds of interference, etc. In order to obtain a high-quality image, methods and different processing programs are resorted to. In this work we have shown how the analysis and processing of images obtained on an atomic force microscope takes place. Methods for obtaining quality AFM images using different software are shown. Initial and processed AFM images of anodic aluminum oxide are presented; artifacts are present in the initial images (software defects during imaging), in the processed images the artifacts are minimized using software.

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