The phenomenon of frustrated total internal reflection in a near-field interference microwave sensing

A new approach is proposed in the problems of active near-field microwave sensing of materials, objects and media. According to it, a probing near field is formed as a result of overlapping evanescent fields arising under conditions of frustrated total internal reflection in the gap between the large faces of two rectangular dielectric prisms. The placement of the studied object in this gap has a noticeable effect on the reflected radiation characteristics. On this basis, not only diagnostics of object quality can be made, but also data on its material parameters can be obtained. A schematic solution of a near-field interference microwave microscope that implements the proposed approach is described. The results of test measurements in the conditions of diagnostics of metallized strips with breaks are presented.

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