Test patterns generation for single stuckat faultsof arbitrary elements of a combinational circuit with using description of elements functions

An algorithm of test patterns generation for single stuck-at faults of arbitrary elements of a combinational circuit is suggested.The algorithm is based on using properties of orthogonal disjunctive normal forms (ODNFs) representing the circuit functions. ODNFsare presented with a structural circuit description and SSBDD - graphs of the circuit elements. ODNFs properties and ODNFs graphicalrepresentation allow essentially to cut calculation when finding test patterns. The experimental results are discussed.

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