Ostanin Sergei A., Bucharov Alexander V., Matrosova Anzhela Y., Kirienko Irina E. «Generating all test patterns for a given stuck-at fault of a logical circuit and its ROBDD implementation» // Tomsk State University Journal of Control and Computer Science 2014. №2(27) C.82-89
Matrosova Anjela Yurievna, Mitrofanov Evgenii Vladimirovich, Shah Toral «Simplification of fully delay testable combinational circuits and finding of PDF test pairs» // Tomsk State University Journal of Control and Computer Science 2017. №39 C.85-93
Andreeva V.V., Goshin G.G., Matrosova A.Yu., Tychinskiy V.Z. «Applying ROBDDS for logical circuit delay testing» // Izvestiya vuzov. Fizika 2019. №5 C.86-94
Matrosova Anzhela Yu., Provkin Viktor A. «Graph representations of the sets of all reachable reactions of the combinational circuit» // Tomsk State University Journal of Control and Computer Science 2022. №61 C.128-138
Sukhoruchenko Ksenia A., Savenkova Marina M., Matrosova Anzhela Yu., Provkin Viktor A. «Testing of multi-output combinational circuits when reactions on test patterns are known» // Tomsk State University Journal of Control and Computer Science 2024. №69 C.134-143
Mitrofanov Evgeniy V., Matrosova Anzhela Yu. «Delay testable sequential circuit design» // 2013. №2(23) C.140-147
