Deposition of the α-Al2O3 coatings by reactiveevaporation with intensive ion assistance under 500-550 °C | Izvestiya vuzov. Fizika. 2020. № 10. DOI: 10.17223/00213411/63/10/144

Deposition of the α-Al2O3 coatings by reactiveevaporation with intensive ion assistance under 500-550 °C

The results of investigation of synthesis conditions and structure of the α phase in A2O3 coatings deposited by reactive anodic evaporation in an arc discharge at low temperature (500-550 °C) are presented. The current density of ion assistance (up to 20 mA/cm2) and the ions energy (25-150 eV) were varied in the experiments at a constant deposition rate of 3 μm/h. The phase composition of the coating was analyzed by x-ray diffraction and infrared spectroscopy. It was shown that the α phase is formed when the threshold bias voltage of 75-100 V is reached and is stable in a limited range of ion energy, the growth of which leads to a decrease in the size of α phase nanocrystallites and coating amorphization. A feature of the coating structure is the preferential orientation (300), the most probable reason for the dominance of which is the growth of the α phase when the orientation relation (440) γ-Al2O3/(300) α-Al2O3 is satisfied.

Download file
Counter downloads: 76

Keywords

Authors

NameOrganizationE-mail
Kamenetskikh A.S.Institute of Electrophysics UB RASalx@iep.uran.ru
Gavrilov N.V.Institute of Electrophysics UB RASgavrilov@iep.uran.ru
Tretnikov P.V.Institute of Electrophysics UB RAStpetr@iep.uran.ru
Chukin A.V.Ural Federal University named after the First President of Russia B.N. Yeltsinachukin@mail.ru
Menshakov A.I.Institute of Electrophysics UB RASmenshakovandrey@mail.ru
Cholakh S.O.Ural Federal University named after the First President of Russia B.N. Yeltsins.o.cholakh@urfu.ru
Всего: 6

References

Holm B., Ahuja R., Yourdshahyan Y., et al. // Phys. Rev. B. - 1999. - V. 59. - No. 20. - P. 12777.
Gitzen W.H. Alumina as a Ceramic Material. - Columbus: American Ceramic Society, 1970.
Jin P., Nakao S., Wang S.X., and Wang L.M. // Appl. Phys. Lett. - 2003. - V. 82. - P. 1024.
Andersson J.M., Wallin E., Helmersson U., et al. // Thin Solid Films. - 2006. - V. 513. - P. 57- 59.
Yamada-Takamura Y., Koch F., Maier H., and Bolt H. // Surf. Coat. Technol. - 2001. - V. 142-144. - P. 260-264.
Cheng Y., Qiu W., Zhou K., et al. // Mater. Res. Express. - 2019. - V. 6. - No. 086412.
Gavrilov N.V., Kamenetskikh A.S., Paranin S.N., et al. // Instrum. Experim. Tech. - 2017. -V. 60. - No. 5. - P. 742.
Gavrilov N.V., Kamenetskikh A.S., Tretnikov P.V., et al. // Surf. Coat. Technol. - 2018. - V. 337. - P. 453.
Kamenetskikh A.S., Gavrilov N.V., Solomonov V.I., e. al. // J. Phys.: Conf. Ser. - 2018. - V. 1115. - P. 032073.
Maeland A.J., Rittenhouse R., Lahar W., et al. // Thin Solid Films. - 1974. - V. 21. - P. 67.
Barker A.S. // Phys. Rev. - 1963. - V. 132. - No. 4. - P. 1474.
Shek C.H., Lai J.K.L., Gu T.S., et al. // Nanostruct. Mater. - 1997. - V. 8. - No. 5. - P. 605.
Chu Y.T., Bates J.B., White C.W., et al. // J. Appl. Phys. -1988. - V. 64. - P. 3727.
McHale J.M., Auroux A., Perrotta A.J., et al. // Science. - 1997. - V. 277. - P. 788.
Houska J. // Surf. Coat. Technol. - 2013. - V. 235. - P. 333.
Zhao J.P., Wang X., Chen Z.Y., et al. // J. Phys. D: Appl. Phys. - 1997. - V. 30. - P. 5.
Finger L.W. and Hazen R.M. // J. Appl. Phys. - 1978. - V. 49. - P. 5823.
Zywitzki O., Hoetzsch G., Fietzke F., et al. // Surf. Coat. Technol. - 1996. - V. 82. - P. 169.
Zywitzki O. and Hoetzsch G. // Surf. Coat. Technol. - 1997. - V. 94. - P. 303.
Chou T.C. and Nieh T.G. // J. Am. Ceram. Soc. - 1991. - V. 74(9). - P. 2270.
Chou T.C. and Nieh T.G. // Thin Solid Films. - 1992. - V. 221. - P. 89.
Wallin E., Selinder T.I., Elfwing M., et al. // EPL. - 2008. - V. 82. - No. 36002.
Kohara T., Tamagaki H., Ikari Y., et al. // Surf. Coat. Technol. - 2004. - V. 185. - P. 166.
Biersack J.P. and Ziegler J.F. // Ion Implantation Techniques / eds. H. Ryssel, H. Glawischnig. Springer Series in Electrophysics. - Berlin; Heidelberg: Springer, 1998. - V. 10.
Prenzel M., Kortmann A., and Stein A. // J. Appl. Phys. - 2013. - V. 114. - No. 113301.
Gavrilov N.V., Kamenetskikh A.S., Tretnikov P.V., et al. // J. Phys.: Conf. Ser. - 2019. - V. 1393. - No. 012082.
 Deposition of the α-Al<sub>2</sub>O<sub>3</sub> coatings by reactiveevaporation with intensive ion assistance under 500-550 °C | Izvestiya vuzov. Fizika. 2020. № 10. DOI: 10.17223/00213411/63/10/144

Deposition of the α-Al2O3 coatings by reactiveevaporation with intensive ion assistance under 500-550 °C | Izvestiya vuzov. Fizika. 2020. № 10. DOI: 10.17223/00213411/63/10/144