Using SAT-solvers for deriving patch circuits that mask nodes faults and trojan circuits injections | Izvestiya vuzov. Fizika. 2020. № 12. DOI: 10.17223/00213411/63/12/114

Using SAT-solvers for deriving patch circuits that mask nodes faults and trojan circuits injections

Combinational circuit C consisting of gates is considered. A sub-circuit with set V of output nodes and set U of input nodes is separated in it. Set V consists of outputs of circuit C fault nodes (logic faults are assumed) and inputs of circuit C fault free nodes that are fed by lines in which Trojan Circuits are injected. Correction of circuit C behavior based on applying as much as possible simple patch circuit (in the frame of Engineering Change Order (ECO) technologies) is suggested. Patch circuit inputs are connected with nodes from set U . Patch circuit outputs are connected either with internal circuit C nodes that are fed by its fault nodes or with nodes that are fed by lines in which Trojan Circuits are injected. Current approaches to correction of circuit C behavior are based on results of circuit C simulation and guarantee correct results on a set of input Boolean vectors that are applied during simulation. We suggest using incompletely specified Boolean functions of nodes from set V and guarantee correct circuit C behavior on all its input vectors. Deriving incompletely specified Boolean functions is based on applying SAT solver. Then incompletely specified Boolean functions of nodes from set V are used by ESPRESSO system followed by ABC system to get patch circuit.

Download file
Counter downloads: 74

Keywords

combinational circuits, incompletely specified Boolean functions, observability function of internal circuit node, Tseitin CNF, Disjoint SoPs, SAT solvers

Authors

NameOrganizationE-mail
Matrosova A.Yu.National Research Tomsk State Universitymau11@yandex.ru
Provkin V.A.National Research Tomsk State Universityprowkan@mail.ru
Tychinskiy V.Z.National Research Tomsk State Universitytvz.041@gmail.com
Nikolaeva E.A.National Research Tomsk State Universitynikolaeve-ea@yandex.ru
Goshin G.G.Tomsk State University of Control Systems and Radioelectronicsgoshingg@svch.tusur.ru
Всего: 5

References

Krishnavami S., Ren H., Modi N., and Puri R. // Proc. Asia and South Pacific Design Automation Conference. - 2009. - P. 789-796.
Cheng A.-C., Jiang H.-R. and Jou J.-Y. // Proc. DATE. - 2016.
Dao A.Q., Lee N.-Z., Chen L.-C., et al. // Proc. DAC. - 2018.
Матросова А.Ю., Останин С.А., Кириенко И.Е. // Изв. вузов. Физика. - 2014. - Т. 57. - № 6. С. 127-132.
Matrosova A., Provkin V., and Nikolaeva E. // Proc. IEEE East-West Design & Test Symposium (EWDTS), 13-16 September 2019. - Batumi: IEEE, 2019. - P. 416-419.
Цейтин Г.С. // Записки научных семинаров ЛОМИ АН СССР. - 1968. - Т. 8. - С. 234-259.
Logic Minimization Software (http://ramos.elo.utfsm.cl/~lsb/elo211/aplicaciones/aplicaciones/espresso/ESPRESSO Logic Minimization Software.htm).
ABC: A System for Sequential Synthesis and Verification (https://people.eecs.berkeley.edu/~alanmi/abc/).
Petkovska А., Mishchtnko A., Novo D., et al. // Advanced Logic Synthesis. - Springer, 2008. -P. 169-188.
Matrosova A., Goloubeva O., and Tsurikov S. // Proc. 6-th Biennal Conf. on Electronics and Microsystems Technology. - Tallinn, 1998. - P. 183-186.
 Using SAT-solvers for deriving patch circuits that mask nodes faults and trojan circuits injections | Izvestiya vuzov. Fizika. 2020. № 12. DOI: 10.17223/00213411/63/12/114

Using SAT-solvers for deriving patch circuits that mask nodes faults and trojan circuits injections | Izvestiya vuzov. Fizika. 2020. № 12. DOI: 10.17223/00213411/63/12/114